The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2024
Filed:
Jun. 14, 2021
Applicant:
Fujifilm Business Innovation Corp., Tokyo, JP;
Inventor:
Yosuke Tashiro, Kanagawa, JP;
Assignee:
FUJIFILM Business Innovation Corp., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
H04N 1/00037 (2013.01); G06T 7/001 (2013.01); H04N 1/00005 (2013.01); H04N 1/00074 (2013.01);
Abstract
An inspection device includes a processor configured to perform a first inspection of using original image data as first reference image data and collating the first reference image data with at least one of plural pieces of read image data obtained by reading image-formed matters obtained by forming the first reference image data on plural recording media, and register read image data satisfying a predetermined criterion among the plural pieces of read image data as a result of the first inspection, as second reference image data for a second inspection different from the first inspection.