The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

Oct. 09, 2019
Applicant:

Hamamatsu Photonics K.k., Hamamatsu, JP;

Inventors:

Ryuji Kyushima, Hamamatsu, JP;

Kazuki Fujita, Hamamatsu, JP;

Junichi Sawada, Hamamatsu, JP;

Takao Aritake, Hamamatsu, JP;

Minoru Ichikawa, Hamamatsu, JP;

Haruyoshi Okada, Hamamatsu, JP;

Seiji Fukamizu, Hamamatsu, JP;

Shuhei Namba, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); A61B 6/00 (2006.01); A61B 6/42 (2024.01); H04N 25/70 (2023.01);
U.S. Cl.
CPC ...
H01L 27/14658 (2013.01); A61B 6/42 (2013.01); A61B 6/44 (2013.01); H01L 27/14603 (2013.01); H04N 25/70 (2023.01);
Abstract

A radiation imaging device according to one embodiment includes a radiation detection panel having a first surface on which a detection region is formed and an electrode pad is formed outside the detection region, and a second surface on a side opposite to the first surface, a base substrate having a support surface configured to face the second surface of the radiation detection panel and configured to support the radiation detection panel, and a flexible circuit substrate connected to the electrode pad via a connecting member, wherein an end portion of the base substrate is located further inward than an inner end portion of the connection region in which the electrode pad, the connecting member, and the flexible circuit substrate overlap each other when seen in an Z direction orthogonal to the support surface.


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