The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

Oct. 21, 2021
Applicant:

Zeteo Tech, Inc., Sykesville, MD (US);

Inventors:

Michael McLoughlin, Sykesville, MD (US);

Ross Kliegman, Sykesville, MD (US);

Tim Cornish, Sykesville, MD (US);

Vadym Berkout, Sykesville, MD (US);

Scott Ecelberger, Sykesville, MD (US);

Gonzalo Arce, Newark, DE (US);

Kyle Regan, Cedar Grove, NJ (US);

Assignee:

ZETEO TECH, INC., Sykesville, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/16 (2006.01); G01N 15/10 (2006.01); G01N 27/64 (2006.01); H01J 49/00 (2006.01); H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
H01J 49/164 (2013.01); G01N 15/10 (2013.01); G01N 27/64 (2013.01); H01J 49/0036 (2013.01); H01J 49/40 (2013.01); G01N 2015/1029 (2024.01); G01N 2015/103 (2024.01);
Abstract

Disclosed are systems are methods for identifying the composition of single aerosol particles, particularly that of bioaerosol particles. A continuous timing laser tightly coupled with a pulse ionization laser is used to index aerosol particles, measure particle properties, and trigger the ionization laser to fire when each particle enters the beam of the trigger laser. Ionized fragments and optionally photons produced when each particle is struck by the ionization laser are analyzed using one or more detectors including a TOF-MS detector and an optical detector. Individual single particle spectra are aligned and denoised prior to averaging.


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