The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

Feb. 02, 2023
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

Aayush Prakash, Toronto, CA;

Shoubhik Debnath, Sunnyvale, CA (US);

Jean-Francois Lafleche, Toronto, CA;

Eric Cameracci, Toronto, CA;

Gavriel State, Toronto, CA;

Marc Teva Law, Ontario, CA;

Assignee:

Nvidia Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G06F 18/10 (2023.01); G06F 18/20 (2023.01); G06F 18/24 (2023.01); G06V 10/764 (2022.01); G06V 10/84 (2022.01); G06V 20/00 (2022.01); G06V 20/56 (2022.01); G06V 20/70 (2022.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); G06F 18/10 (2023.01); G06F 18/24 (2023.01); G06F 18/29 (2023.01); G06V 10/764 (2022.01); G06V 10/84 (2022.01); G06V 20/00 (2022.01); G06V 20/70 (2022.01); G06V 20/56 (2022.01);
Abstract

Approaches are presented for training and using scene graph generators for transfer learning. A scene graph generation technique can decompose a domain gap into individual types of discrepancies, such as may relate to appearance, label, and prediction discrepancies. These discrepancies can be reduced, at least in part, by aligning the corresponding latent and output distributions using one or more gradient reversal layers (GRLs). Label discrepancies can be addressed using self-pseudo-statistics collected from target data. Pseudo statistic-based self-learning and adversarial techniques can be used to manage these discrepancies without the need for costly supervision from a real-world dataset.


Find Patent Forward Citations

Loading…