The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

Apr. 11, 2022
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

Zhaoxuan Ma, Shenzhen, CN;

De Cai, Shenzhen, CN;

Hu Ye, Shenzhen, CN;

Xiao Han, Shenzhen, CN;

Yanqing Kong, Shenzhen, CN;

Hongping Tang, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 11/00 (2006.01); G06V 10/75 (2022.01); G06V 10/764 (2022.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 11/00 (2013.01); G06V 10/75 (2022.01); G06V 10/764 (2022.01); G06V 20/695 (2022.01); G06T 2207/30024 (2013.01); G06T 2207/30096 (2013.01); G06T 2210/41 (2013.01);
Abstract

An image display method includes: processing a first image to obtain a first feature image, the first image being an image of a local area of a smear captured by a microscope, and the local area including multiple objects to be tested; obtaining a second feature image corresponding to the first feature image, the second feature image and the first feature image having a same size; obtaining a third feature image according to an image obtained by overlaying the first feature image and the second feature image, a feature point in the third feature image indicating a possibility that one of the multiple objects is an abnormal object; obtaining a second image according to the third feature image; and displaying the second image superimposed on the first image.


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