The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

May. 11, 2021
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Kyong Tae Park, Yongin-si, KR;

Dong Hoon Jeong, Yongin-si, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 18/21 (2023.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01); G06T 7/00 (2017.01); G06T 7/62 (2017.01); H10K 59/12 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 18/217 (2023.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G06T 7/0004 (2013.01); G06T 7/62 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01); H10K 59/12 (2023.02);
Abstract

According to an embodiment of the disclosure, an aperture ratio measurement device includes an actual aperture ratio measurement unit which image some mother substrates selected from a plurality of mother substrates and calculate an aperture ratio actual measurement value of a pixel for the imaged some mother substrates, an estimation aperture ratio measurement unit which learn sensing data for each of the plurality of mother substrates and calculate an aperture ratio prediction value of a pixel for all or a group of the plurality of mother substrates, and an addition unit which calculate a final aperture ratio prediction value based on the aperture ratio actual measurement value and the aperture ratio prediction value.


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