The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

Jan. 19, 2022
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Ali Aiouaz, Bee Cave, TX (US);

Walter A. O'Brien, III, Westborough, MA (US);

Leland W. Thompson, Tustin, CA (US);

James Ulery, Eastvale, CA (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0655 (2013.01); G06F 3/0604 (2013.01); G06F 3/0653 (2013.01); G06F 3/0679 (2013.01);
Abstract

A read-disturb-based read temperature information access system includes a read-disturb-based read temperature information management subsystem coupled to a plurality of storage devices that each include a read-disturb-based read temperature information Application Programming Interface (API). Each storage device generates and stores read-disturb-based read temperature information associated with that storage device, and when a read-disturb-based read temperature information command is received from the read-disturb-based read temperature information management subsystem that conforms to the read-disturb-based read temperature information API, the storage device receiving that read-disturb-based read temperature information command will execute it to perform at least one operation using the read-disturb-based read temperature information associated with and stored by that storage device.


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