The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

May. 08, 2019
Applicant:

Aspentech Corporation, Bedford, MA (US);

Inventors:

Sebastian Terrazas-Moreno, Houston, TX (US);

Dimitrios Varvarezos, Houston, TX (US);

Stacy Janak, Katy, TX (US);

Assignee:

ASPENTECH CORPORATION, Bedford, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/9035 (2019.01); G06F 16/906 (2019.01);
U.S. Cl.
CPC ...
G06F 16/9035 (2019.01); G06F 16/906 (2019.01);
Abstract

Disclosed are methods and systems that help identify critical variables for more efficient and robust plan validation process. An example embodiment is a computer implemented method of industrial process control. The example method includes receiving in computer memory a dataset including initial process parameters representing operational data of a subject industrial process, and, using filtering operations and grouping operations on the dataset, identifying a subset of the process parameters indicative of control data for controlling the subject industrial process. The example method further includes automatically applying the identified subset of process parameters controlling the subject industrial process.


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