The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

Aug. 30, 2021
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Hideyuki Nakagawa, Kawasaki, JP;

Yasunori Taguchi, Kawasaki, JP;

Hiro Gangi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/245 (2019.01); G06F 3/0482 (2013.01); G06F 16/22 (2019.01); G06F 16/2453 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24532 (2019.01); G06F 3/0482 (2013.01); G06F 16/2264 (2019.01);
Abstract

According to one embodiment, a parameter optimization apparatus stores data sets which each include a first parameter value of a first number of dimensions and an observed value of an objective function corresponding to the first parameter value. The apparatus determines a search space of a second number of dimensions smaller than the first number of dimensions. The apparatus acquires one or more data sets each having a first parameter value present within a predetermined distance from the search space. The apparatus searches the search space for a first parameter value that may optimize the objective function, using a surrogate model of an objective function based on one or more data sets acquired.


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