The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

Aug. 05, 2021
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventor:

Madoka Baba, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3688 (2013.01); G06F 11/3692 (2013.01);
Abstract

If an (i−1)-th test case which is a test case for step 1 to step (i−1) is stored, a generation control unit () selects a first generation scheme (M) which uses the (i−1)-th test case to generate an i-th test case which is a test case for step 1 to step i. A test generation unit () generates a test case for executing an i-th step in a state where an internal state at an end of the (i−1) steps caused by execution for the (i−1)-th test case is retained, in accordance with the first generation scheme (M). The test generation unit () generates the i-th test case by joining the (i−1)-th test case and the test case for the i-th step.


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