The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2024
Filed:
Oct. 19, 2020
Fanuc Corporation, Yamanashi, JP;
Satoshi Ikai, Yamanashi, JP;
Tomoyuki Aizawa, Yamanashi, JP;
Fanuc Corporation, Tokyo, JP;
Abstract
An apparatus configured to facilitate identifying a factor for a defect if the defect occurs in a finished surface of the workpiece. An apparatus includes a movement path generation section configured to generate the movement path of the industrial machine when performing a work on a workpiece; a running information acquisition section configured to acquire running information of the industrial machine when performing a work on the workpiece; and an image data generation section configured to generate the image data in which a first point on the movement path corresponding to a change point of first running information, and a second point on the movement path corresponding to a change point of second running information different from the first running information are highlighted on the movement path in display forms visually different from each other.