The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

Mar. 30, 2023
Applicant:

Kyushu University, National University Corporation, Fukuoka, JP;

Inventor:

Atsushi Shimada, Fukuoka, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/92 (2006.01); G01N 33/487 (2006.01);
U.S. Cl.
CPC ...
G01N 33/92 (2013.01); G01N 33/48721 (2013.01);
Abstract

A membrane protein analysis substrate including an electron microscope grid having a plurality of through-holes; a lipid bilayer membrane that is provided to cover at least one of the plurality of through-holes; and membrane proteins that are retained in a part planarly overlapping the through-holes of the lipid bilayer membrane, wherein the lipid bilayer membrane has a lipid monolayer, and wherein the lipid monolayer is larger than the through hole in a plan view, adheres to the grid, and constitutes a part of the lipid bilayer membrane.


Find Patent Forward Citations

Shimada, Atsushi. (2024). Membrane protein analysis substrate, method of producing membrane protein analysis substrate, method of analyzing membrane protein and membrane protein analysis grid (U.S. Patent No. 11994525). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11994525

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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