The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

Jul. 24, 2020
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);

Inventors:

Jennifer A. Dionne, Menlo Park, CA (US);

Amr Ahmed Essawi Saleh, Palo Alto, CA (US);

Daniel K. Angell, San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01J 3/44 (2013.01); G01N 2021/655 (2013.01);
Abstract

Improved stimulated Raman spectroscopy is provided by replacing the Stokes (or anti-Stokes) optical source with a localized electromagnetic emitter that is excited with a non-electromagnetic excitation. Such a localized emitter can be an efficient Stokes (or anti-Stokes) source for stimulated Raman spectroscopy, and can also provide deep sub-wavelength spatial resolution. In a preferred embodiment, an electron beam from an electron microscope is used to excite the localized emitter. This provides combined Raman imaging and electron microscopy that has the two imaging modalities inherently registered with each other.


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