The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2024
Filed:
Sep. 14, 2021
Bruker Optik Gmbh, Ettlingen, DE;
Roland Harig, Waldbronn, DE;
Stephan Luettjohann, Karlsruhe, DE;
BRUKER OPTICS GMBH & CO. KG, Ettlingen, DE;
Abstract
A method for determining a correcting quantity function k(x, y) for calibrating an FTIR measurement arrangement with an IR detector. The IR detector includes a plurality of sensor elements, which are each located at a position (x, y), and the method includes: (a) recording interferograms IFGof a reference sample using the sensor elements of the IR detector, (b) calculating spectra Rof the reference sample by Fourier transforming the interferograms of the reference sample for at least four sensor elements, (c) calculating correcting quantities kby comparing each spectrum Rof the reference sample calculated in step b) with a reference data set of the reference sample, and (d) determining the correcting quantity function k(x, y) using the correcting quantities kcalculated in step c). This permits frequency shifts that occur in FTIR spectrometers with extensive detectors to be effectively corrected regardless of the position of the sensor element.