The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

Feb. 23, 2021
Applicant:

Senfit Oy, Oulu, FI;

Inventors:

Pekka Jakkula, Oulu, FI;

Juha Heikkinen, Oulu, FI;

Matti Limingoja, Oulu, FI;

Mikko Vuolteenaho, Oulu, FI;

Assignee:

Senfit Oy, Oulu, FI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 15/04 (2006.01); G01N 22/00 (2006.01); G01N 33/20 (2019.01); G01S 7/40 (2006.01); G01S 13/06 (2006.01);
U.S. Cl.
CPC ...
G01B 15/04 (2013.01); G01N 22/00 (2013.01); G01N 33/20 (2013.01); G01S 7/4056 (2013.01); G01S 13/06 (2013.01);
Abstract

An apparatus for measuring a surface comprises first sensors, which are distributed two-dimensionally in space, said first sensors interacting with the surface in a contactless manner using a microwave range of electromagnetic signals, and the first sensors receive at least two of the microwave signals of the interaction with information relating to distances between the sensors and the surface as a reflection, the microwave signals of the interaction representing both dimensions of the space of two-dimensional distribution of the first sensors. A data processing unit receives said information on the distances, and determines at least one geometrical parameter of the surface on the basis of the information.


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