The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2024
Filed:
Jun. 26, 2018
Eos Gmbh Electro Optical Systems, Krailling, DE;
Thomas Mattes, Gilching, DE;
Jochen Philippi, Gräfelfing, DE;
EOS GmbH Electro Optical Systems, Krailling, DE;
Abstract
A measuring system serves for equipping or retrofitting a device for manufacturing a three-dimensional object by selective layerwise solidification of a building material. The device includes an irradiator for selectively irradiating a layer of the building material applied in a working plane of the device at locations corresponding to a cross-section of the object to be manufactured. The irradiator includes at least two irradiation units, and each irradiation unit can be projected onto a pixel in the working plane and can be at least switched on and off. The measuring system includes at least one camera for determining and evaluating the radiation emitted by the irradiator and/or the position and/or orientation of the irradiation unit(s) in absolute and/or relative to one another, and at least one distance sensor for detecting an extension in a direction (z) perpendicular to the working plane.