The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

May. 24, 2022
Applicant:

Gecko Robotics, Inc., Pittsburgh, PA (US);

Inventors:

Edward A. Bryner, Pittsburgh, PA (US);

Edwin H. Cho, Pittsburgh, PA (US);

Kevin Y. Low, Pittsburgh, PA (US);

Michael A. Binger, Pittsburgh, PA (US);

Assignee:

Gecko Robotics, Inc., Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B62D 57/024 (2006.01); B25J 5/00 (2006.01); B25J 9/00 (2006.01); B25J 9/16 (2006.01); B25J 13/00 (2006.01); B25J 13/08 (2006.01); B25J 19/02 (2006.01); B60B 19/00 (2006.01); B60B 19/12 (2006.01); B60K 1/02 (2006.01); B62D 53/02 (2006.01); G01N 29/04 (2006.01); G01N 29/22 (2006.01); G01N 29/265 (2006.01); G06F 1/20 (2006.01); H05K 1/18 (2006.01);
U.S. Cl.
CPC ...
B25J 13/087 (2013.01); B25J 5/007 (2013.01); B25J 9/0009 (2013.01); B25J 9/1617 (2013.01); B25J 9/163 (2013.01); B25J 9/1653 (2013.01); B25J 9/1664 (2013.01); B25J 9/1674 (2013.01); B25J 9/1694 (2013.01); B25J 13/006 (2013.01); B25J 19/021 (2013.01); B25J 19/027 (2013.01); B60B 19/006 (2013.01); B60B 19/12 (2013.01); B60K 1/02 (2013.01); B62D 53/02 (2013.01); B62D 57/024 (2013.01); G01N 29/04 (2013.01); G01N 29/226 (2013.01); G01N 29/265 (2013.01); G06F 1/206 (2013.01); H05K 1/18 (2013.01); B60B 2360/102 (2013.01); B60B 2360/104 (2013.01); B60B 2360/109 (2013.01); B60B 2900/931 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/2698 (2013.01); G06F 2200/201 (2013.01); H05K 2201/10151 (2013.01);
Abstract

Methods and apparatus for verifiable inspection operations are described. An example apparatus may have an inspection description circuit to interpret an inspection definition value and a payload status circuit to provide a payload identification value in response to at least one of a payload specific configuration or signals from a payload. The example apparatus may also have an inspection integrity circuit to determine an inspection description value in response to the inspection definition value and the payload identification value and an inspection reporting circuit to communicate the inspection description value to an external device.


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