The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

Sep. 03, 2021
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Ippei Takeuchi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
B01L 3/502746 (2013.01); B01L 3/502707 (2013.01); B01L 3/502715 (2013.01); B01L 2200/0689 (2013.01); B01L 2200/16 (2013.01); B01L 2300/04 (2013.01); B01L 2300/069 (2013.01); B01L 2300/0883 (2013.01); B01L 2400/0487 (2013.01);
Abstract

A test apparatus for a test using a test solution containing a sample with the use of a microchannel device is provided. The test apparatus includes a pressure application unit that is connected to a first opening and applies an air pressure to inject the test solution into a microchannel, an opening and closing unit that switches between opening and closing of a second opening, and a controller that controls the pressure application unit and the opening and closing unit. The controller controls the opening and closing unit to close the second opening, controls the pressure application unit to inject the test solution into the microchannel, controls the opening and closing unit to open the second opening after the test solution is injected into the microchannel, and controls the pressure application unit to apply an air pressure to collect in a collection portion, the test solution in a branch channel.


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