The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2024
Filed:
Dec. 30, 2020
Agco Corporation, Duluth, GA (US);
Kevin J. Hamilton, Newton, KS (US);
Patrick Kendrick, Hesston, KS (US);
AGCO Corporation, Duluth, GA (US);
Abstract
A baler includes a near-infrared testing system configured to receive near-infrared radiation reflected by plant material in a bale and to analyze the near-infrared radiation and generate evaluation data reflecting one or more properties of the plant material. The near-infrared testing system is calibrated using a calibration sample at a calibration temperature. A temperature sensor measures a sample temperature of a crop sample of the plant material and a temperature alteration mechanism adjusts the sample temperature of the crop sample so that the sample temperature matches the calibration temperature of the calibration sample before the near-infrared testing system receives the near-infrared radiation reflected by the plant material. A computer receives and combine the evaluation data of the plant material to produce overall evaluation data reflecting one or more overall properties for the at least one bale of the plurality of bales, and assign the overall evaluation data to the bale.