The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2024
Filed:
Aug. 05, 2022
International Business Machines Corporation, Armonk, NY (US);
Kevin Daniel Escobar, Rochester, MN (US);
Layne A. Berge, Rochester, MN (US);
George Paulik, Rochester, MN (US);
George Russell Zettles, IV, Rochester, MN (US);
Daniel Ramirez, Rochester, MN (US);
Jarrett Betke, Hoffman Estates, IL (US);
Karl Erickson, Rochester, MN (US);
Timothy Clyde Buchholtz, Rochester, MN (US);
Timothy Lindquist, Rochester, MN (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
One or more systems, devices, and/or methods provided herein relate to a process for in-process radio frequency (RF) signal quality analysis and amplitude adjustment of one or more RF devices. In one or more embodiments, the RF device can comprise a portion of a quantum computing system, such as of readout electronics thereof, and thus amplitude adjustment can be at a waveform generator that generates pulses to affect one or more qubits of a quantum logic circuit of the quantum computing system. Generally, an electronic device can comprise an RF tap connected to an RF signal component of a first RF signal chain, and an analysis component connected to the RF tap, the analysis component configured to convert an RF signal from the RF signal component and to compare a conversion result thereof to an expected power output that is based on historical data for a second RF signal chain.