The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2024
Filed:
Feb. 03, 2020
Dh Technologies Development Pte. Ltd.;
Thomas R. Covey, Newmarket, CA;
Chang Liu, Richmond Hill, CA;
Gary J. Van Berkel, Oak Ridge, TN (US);
DH Technologies Development Pte. Ltd., Singapore, SG;
Abstract
A method for the repeated analysis of a sample bearing location. The sample bearing location may include, for instance, a sampled point in a tissue slice that is spatially and temporally correlated to the original slice. The slice may be in whole, or in part, a complete item or a portion of a complete item such as, for example, a human organ. The method improves the analysis process, such as mass spectrometry analysis, by providing a much more complete characterization of the target. The method also allows for the splitting of the sample and chemical/physical alteration of the aliquots for enhanced chemical analysis.