The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2024
Filed:
Aug. 24, 2017
Cerner Innovation, Inc., Kansas City, KS (US);
Cole A. Erdmann, Kansas City, MO (US);
Timothy J. Arnold, Chicago, IL (US);
Xinyong Tian, Wilmette, IL (US);
Cerner Innovation, Inc., Kansas City, MO (US);
Abstract
Methods, systems, and computer-storage media are provided for determining an individual's second event risk score where the second event risk score represents a likelihood that the individual will experience the second event within a predetermined time period after the occurrence of a first event. Upon occurrence of the first event, a sampling protocol is initiated where an electronic medical record store is accessed on a predetermined schedule to sample a pre-selected set of medical data elements for the individual. Logistic regression analysis is executed on the pre-selected set of medical data elements to generate a second event risk score for the individual. The second event risk score is communicated to a medical professional managing the medical care of the individual, and the individual's electronic medical record is modified to reflect the second event risk score.