The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Mar. 01, 2018
Applicant:

Ayasdi Ai Llc, Menlo Park, CA (US);

Inventors:

Allison Gilmore, Redwood City, CA (US);

Tzu-Wei Powers, Mountain View, CA (US);

Alan Lehman, Palo Alto, CA (US);

Cindy Zhang, San Jose, CA (US);

Assignee:

SymphonyAI Sensa LLC, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16H 40/20 (2018.01); G06T 11/20 (2006.01); G16H 15/00 (2018.01);
U.S. Cl.
CPC ...
G16H 40/20 (2018.01); G06T 11/206 (2013.01); G16H 15/00 (2018.01);
Abstract

An example system includes a memory, processor, and instructions to receive a set of multidimensional adjudicated claims data, receive metric and lens functions, perform the metric and lens functions on a set of dimensions of the claims data to map claims to a reference space, generate cover of overlapping sets of the reference space, cluster the mapped claims in the reference space using the cover to identify nodes and edges, identify groups of nodes in a graph based on known improperly denied, for each group, identify differentiating drivers, and generate a denials application user interface depicting different cards for each of at least a subset of the identified groups in the graph that includes the known improperly denied claims, each card indicating a set of primary statistics of the claims in the nodes of that group, for each card depicting the differentiating drivers of that group.


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