The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

May. 16, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Toru Takahashi, Tokyo, JP;

Rui Ishiyama, Tokyo, JP;

Kengo Makino, Tokyo, JP;

Yuta Kudo, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 3/10 (2024.01); G06T 7/11 (2017.01); G06V 10/40 (2022.01); G06V 10/74 (2022.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06V 10/753 (2022.01); G06T 3/10 (2024.01); G06T 7/11 (2017.01); G06V 10/40 (2022.01); G06V 10/761 (2022.01); G06T 2207/20021 (2013.01);
Abstract

An image matching apparatus matching a first image against a second image includes an acquiring unit, a generating unit, and a determining unit. The acquiring unit acquires a frequency feature of the first image and a frequency feature of the second image. The generating unit synthesizes the frequency feature of the first image and the frequency feature of the second image, and generates a quantized synthesized frequency feature in which a value of an element is represented by a binary value or a ternary value. The determining unit calculates a score indicating a degree to which the quantized synthesized frequency feature is a square wave having a single period, and matches the first image against the second image based on the score.


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