The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Nov. 26, 2020
Applicant:

Trinamix Gmbh, Ludwigshafen am Rhein, DE;

Inventors:

Patrick Schindler, Ludwigshafen, DE;

Benjamin Rein, Ludwigshafen, DE;

Christian Bonsignore, Ludwigshafen, DE;

Michael Eberspach, Ludwigshafen, DE;

Peter Schillen, Ludwigshafen, DE;

Assignee:

TRINAMIX GMBH, Ludwigshafen am Rhein, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/22 (2006.01); G01B 11/25 (2006.01); G06V 10/141 (2022.01); G06V 10/145 (2022.01); G06V 10/147 (2022.01); G06V 10/94 (2022.01); G06V 20/64 (2022.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/22 (2013.01); G01B 11/2513 (2013.01); G06V 10/141 (2022.01); G06V 10/145 (2022.01); G06V 10/147 (2022.01); G06V 10/94 (2022.01); G06V 20/647 (2022.01);
Abstract

Disclosed herein is a display device including an illumination source for projecting an illumination pattern including a plurality of illumination features on a scene; an optical sensor for determining a first image including a plurality of reflection features; a translucent display, where the illumination source and the optical sensor are placed in a direction of propagation of the illumination pattern in front of the display; and an evaluation device configured for evaluating the first image by identifying and sorting the reflection features with respect to brightness, each reflection feature including a beam profile, determining a longitudinal coordinate for each reflection feature by analyzing their beam profiles, unambiguously matching reflection features with corresponding illumination features using the longitudinal coordinate classifying a reflection feature as a real feature or a false feature, rejecting the false features, and generating a depth map for the real features using the longitudinal coordinate.


Find Patent Forward Citations

Loading…