The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Sep. 02, 2022
Applicant:

Illumina, Inc., San Diego, CA (US);

Inventors:

Abde Ali Hunaid Kagalwalla, San Diego, CA (US);

Eric Jon Ojard, San Francisco, CA (US);

Rami Mehio, San Diego, CA (US);

Gavin Derek Parnaby, Laguna Niguel, CA (US);

Nitin Udpa, San Diego, CA (US);

Bo Lu, San Diego, CA (US);

John S. Vieceli, Encinitas, CA (US);

Assignee:

Illumina, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/23213 (2023.01); G06F 18/20 (2023.01); G06V 10/56 (2022.01);
U.S. Cl.
CPC ...
G06F 18/23213 (2023.01); G06F 18/285 (2023.01); G06V 10/56 (2022.01);
Abstract

The technology disclosed extracts intensities from sequencing images for base calling target clusters and attenuates spatial crosstalk from neighboring clusters. The technology disclosed accesses a particular section from a plurality of sections of an image output by a sensor, the particular section of the image including at least one pixel depicting intensity emission values from a target cluster and neighboring clusters located across the sensor, and convolves the particular section of the image with a corresponding convolution kernel in a plurality of convolution kernels, to generate a feature map comprising a plurality of feature values. The technology disclosed further assigns a corresponding feature value to the target cluster based on feature values in the plurality of feature values adjoining a center of the target cluster, and processes the corresponding feature value assigned to the target cluster, to base call the target cluster.


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