The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2024
Filed:
Jan. 12, 2021
Truvalue Labs, Inc., San Francisco, CA (US);
Greg Paul Bala, Auburn, CA (US);
Michael Alfred Flowers, Alameda, CA (US);
Adam L. Salvatori, Cortlandt Manor, NY (US);
Sebastian Brinkmann, San Francisco, CA (US);
Stephen Malinak, Napa, CA (US);
Eli Reisman, Berkeley, CA (US);
Andrew Shipley, Brooklyn, NY (US);
Mark Strehlow, San Francisco, CA (US);
Hendrik Bartel, San Francisco, CA (US);
Philip Kim, Redwood City, CA (US);
James Hawley, Oakland, CA (US);
Edwin Kuh, New York, NY (US);
TruValue Labs, INC., San Francisco, CA (US);
Abstract
A data analysis system for measuring a materiality feature of interest is disclosed. The system includes a computing cluster ingesting content comprising a plurality of observables relevant to an entity, wherein each observable is related to at least one feature of interest. The system further includes an extraction engine running on the computing cluster and tagging the observables with an entity identifier in response to the observables referencing at least one of an entity, a tradename associated with the entity, or product associated with the entity. Additionally, the system includes an analysis engine running on the computing cluster and tagging an observable in response to the feature of interest being related to the observable. In one embedment, the analysis engine measures the materiality of the feature of interest to the entity by counting a number of observables from the plurality of observables tagged with the entity identifier.