The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2024
Filed:
Oct. 19, 2023
Zhejiang Lab, Zhejiang, CN;
Yihan Wang, Hangzhou, CN;
Yiteng Zhai, Hangzhou, CN;
Yao Yang, Hangzhou, CN;
Jiaxi Yang, Hangzhou, CN;
Yang Chen, Hangzhou, CN;
ZHEJIANG LAB, Hangzhou, CN;
Abstract
The present application disclose a method and a device for detecting and correcting abnormal scoring of peer reviews, which includes: converting collected scoring data into a two-dimensional matrix and preprocessing the data; determining the anomaly of the processed structured data with a one-way anomaly detection method, a consistency check method and a two-way anomaly detection method, and classifying the detected abnormal data into an abnormal data set; repairing the abnormal data for the abnormal data set with an information entropy correction method; generating an ability evaluation report according to the abnormal data set, performing weighed averaging on the corrected scoring data according to the scoring weights of reviewers in the ability evaluation report to obtain a final scoring result, and generating an abnormal scoring correction report. The present application can effectively detect the abnormal phenomenon of peer reviews in the performance appraisal of enterprise personnel.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile