The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Jun. 29, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventor:

Takaaki Tateishi, Yamato, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 8/41 (2018.01); G06F 9/455 (2018.01); G06F 11/34 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3664 (2013.01);
Abstract

A computer-implemented method, system and computer program product for effectively handling mock objects written in the form of multiple assignment instructions. A program to test software is instrumented so as to obtain an instrumented program having one or more mock objects. The instrumented program is parsed to identify one or more multiple assignment instructions each corresponding to a mock object. A function is then inserted in the instrumented program for each of the identified multiple assignment instructions corresponding to a mock object, where the function returns a tuple of the first 'n' elements of the mock object. The instrumented program (after inserting the function(s) discussed above) is outputted to perform software testing, such as dynamic program analysis. In this manner, by inserting such function(s) in the instrumented program, the mock objects will be able to be executed without causing a failure.


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