The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Feb. 24, 2022
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Sandeep Bhat, Pleasanton, CA (US);

Rohit Shrikant Patwardhan, Maharashtra, IN;

Rahul Ghanashyam Joglekar, Pune, IN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01); G06F 18/214 (2023.01); G06F 40/42 (2020.01); G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3688 (2013.01); G06F 11/3692 (2013.01); G06F 18/214 (2023.01); G06F 40/42 (2020.01); G06N 20/20 (2019.01);
Abstract

Methods, systems, and apparatuses, including computer programs encoded on computer-storage media, for prioritizing test cases. Processes may include obtaining test artifacts that were generated based on testing one or more legacy versions of a software application using multiple test cases, generating a risk index based at least on the test artifacts that were generated based on testing the one or more legacy versions of the software application using the multiple test cases, and training an ensemble model that is configured to identify likely unnecessary or redundant test cases in connection with in testing an updated version of the software application, based at least on the risk index.


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