The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2024
Filed:
Jan. 18, 2019
Nec Corporation, Tokyo, JP;
Kosuke Yoshida, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An abnormality detection apparatus () includes storage means () for storing a learned self-encoder () including predetermined number of two or more of elements as input layers, extraction means () for extracting a target data group of a predetermined period including data pieces from time series data measured by one or more sensors, the number of the data pieces being the predetermined number, conversion means () for converting the target data group into multi-dimensional vector data including the predetermined number of elements, identifying means () for identifying a time period in which there may be a cause of an abnormality from the predetermined period based on a difference between output vector data having the predetermined number of elements obtained by inputting the multi-dimensional vector data to the self-encoder () and the multi-dimensional vector data, and output means () for outputting abnormality detection information including the identified time period.