The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Feb. 03, 2020
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Toshifumi Minemoto, Kyoto, JP;

Reiko Hattori, Kyoto, JP;

Yuya Ota, Kyotanabe, JP;

Shinsuke Kawanoue, Kyoto, JP;

Akira Nakajima, Otsu, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41875 (2013.01); G05B 19/4183 (2013.01); G05B 23/0221 (2013.01); G05B 2219/32368 (2013.01);
Abstract

A display system provided in production equipment having driving means and monitoring means with controllable features includes a control unit, a display unit, and a storage unit. The control unit obtains a feature output over time from at least one among the driving means and the monitoring means, and causes the storage unit to store the feature; constructs, in each prescribed time, a causal relationship model that indicates a causal factor selected from among the driving means and the monitoring means for at least one abnormality that can occur in the production equipment and that also indicates the relationship between causal factors on the basis of the obtained feature; and displays, on the display unit, a plurality of causal relationship models constructed in a plurality of times.


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