The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Mar. 09, 2020
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Paul Ryan Craddock, Scituate, MA (US);

Lalitha Venkataramanan, Lexington, MA (US);

Prakhar Srivastava, Pune, IN;

Harish Baban Datir, Tananger, NO;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/10 (2006.01); E21B 49/00 (2006.01); G01N 33/24 (2006.01); G06N 3/04 (2023.01); G06N 3/045 (2023.01); G06N 3/08 (2023.01); G06N 3/084 (2023.01); G06N 3/088 (2023.01); E21B 49/02 (2006.01); G06N 3/082 (2023.01);
U.S. Cl.
CPC ...
G01V 5/101 (2013.01); E21B 49/00 (2013.01); E21B 49/005 (2013.01); G01N 33/24 (2013.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01); G06N 3/084 (2013.01); G06N 3/088 (2013.01); E21B 49/02 (2013.01); E21B 2200/20 (2020.05); E21B 2200/22 (2020.05); G06N 3/082 (2013.01);
Abstract

Methods and systems are provided to learn and apply a mapping function from data representing concentrations of atomic elements in a geological formation (or other data corresponding thereto) to mineral component concentrations in the geological formation (and/or from mineral component concentrations to reconstructed elemental concentrations in the geological formation). The mapping function can be derived from a trained neural network (such as an autoencoder). The output of the mapping function can be used to determine estimates of one or more formation properties, such as formation matrix density, formation porosity, matrix Sigma, formation saturation, other formation property, or combinations thereof.


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