The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Sep. 03, 2020
Applicants:

Kyoto University, Kyoto, JP;

Sumida Corporation, Tokyo, JP;

Inventors:

Norikazu Mizuochi, Kyoto, JP;

Ernst David Herbschleb, Kyoto, JP;

Assignees:

KYOTO UNIVERSITY, Kyoto, JP;

SUMIDA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01N 24/00 (2006.01); G01R 33/32 (2006.01);
U.S. Cl.
CPC ...
G01R 33/323 (2013.01); G01N 24/006 (2013.01);
Abstract

In a measurement using a quantum sensor, the range of measurable physical quantities is increased while maintaining sensor sensitivity. A measuring device () comprises an irradiation unit () that irradiates a quantum sensor element () with electromagnetic waves for operating an electron spin state of the quantum sensor element () that changes due to interaction () with a measurement target (), in a pulse sequence in which a time τ between n/2 pulses is a variable value; and a physical quantity measuring unit () that calculates a physical quantity of the measurement target based on the electron spin state after the interaction with the measurement target ().


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