The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Dec. 16, 2021
Applicant:

Toyo Corporation, Tokyo, JP;

Inventors:

Kentaro Suetsugu, Tokyo, JP;

Congbing Li, Tokyo, JP;

Tetsuya Nakamura, Tokyo, JP;

Assignee:

TOYO Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); H04B 17/345 (2015.01); H04B 17/391 (2015.01);
U.S. Cl.
CPC ...
G01R 29/0835 (2013.01); G01R 29/0871 (2013.01); H04B 17/345 (2015.01); G01R 29/0892 (2013.01); H04B 17/3912 (2015.01);
Abstract

A related interference wave presentation device includes a class specifying processer circuitry configured to specify a class to which a reference interference wave, which is a referenced interference wave, belongs, using a learned model generated by machine learning of sample data including interference waves to specify a class to which an interference wave belongs based on feature values of the interference wave, a related interference wave information generator configured to retrieve the sample data based on the class to which the reference interference wave belongs and generate related interference wave information which is information about a related interference wave; and a presentation controller configured to perform control to present the related interference wave information in part or in whole.


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