The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2024
Filed:
Jul. 25, 2022
Applicants:
Beckman Coulter, Inc., Brea, CA (US);
Dh Technologies Development Pte. Ltd., Singapore, SG;
Inventors:
Aaron Hudson, Northborough, MA (US);
Takayuki Mizutani, Edina, MN (US);
Subhasish Purkayastha, Acton, MA (US);
Thomas W. Roscoe, Prior Lake, MN (US);
Assignees:
Beckman Coulter, Inc., Brea, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/68 (2006.01); G01N 27/624 (2021.01); H01J 49/00 (2006.01); H01J 49/02 (2006.01);
U.S. Cl.
CPC ...
G01N 33/6848 (2013.01); G01N 27/624 (2013.01); H01J 49/0031 (2013.01); H01J 49/0036 (2013.01); H01J 49/025 (2013.01);
Abstract
An integrated sample processing system including an analyzer and a mass spectrometer is disclosed. The integrated sample processing system can perform multiple different types of detection, thereby providing improved flexibility and better accuracy in processing samples. The detection systems in the sample processing system may include an optical detection system and a mass spectrometer.