The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Apr. 24, 2020
Applicants:

Kawano Lab. Inc., Osaka, JP;

Tablemark Co., Ltd., Tokyo, JP;

Inventors:

Makoto Kawano, Ikeda, JP;

Ayako Tatematsu, Tokyo, JP;

Ryosuke Abe, Tokyo, JP;

Assignees:

KAWANO Lab. Inc., Osaka, JP;

TableMark Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/76 (2006.01); A23L 27/00 (2016.01); A23P 10/30 (2016.01); B01J 13/02 (2006.01); G01N 15/00 (2006.01); G01N 15/10 (2006.01); G01N 15/1031 (2024.01); B01J 13/04 (2006.01);
U.S. Cl.
CPC ...
G01N 27/76 (2013.01); A23L 27/72 (2016.08); A23P 10/30 (2016.08); G01N 15/1031 (2013.01); B01J 13/02 (2013.01); B01J 13/04 (2013.01); G01N 2015/0038 (2013.01); G01N 2015/1027 (2024.01);
Abstract

The method for particle analysis includes a first magnetic susceptibility measurement step Sof measuring a volume magnetic susceptibility of each of first particles p; an encapsulation treatment step Sof performing an encapsulation treatment so that the first particles pencapsulate an encapsulation target component pt smaller than the first particles p; a second magnetic susceptibility measurement step Sof measuring a volume magnetic susceptibility of each of second particles pas an analysis target that are the first particles pafter the encapsulation treatment; and a step Sof analyzing whether or not the encapsulation target component pt is encapsulated in the second particles pbased on a result of measurement in the first magnetic susceptibility measurement step Sand a result of measurement in the second magnetic susceptibility measurement step S


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