The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Oct. 25, 2021
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventor:

Craig Magera, Simpsonville, SC (US);

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/417 (2006.01); G01N 23/046 (2018.01); G01N 23/18 (2018.01); G01N 27/416 (2006.01); G06N 20/00 (2019.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/4175 (2013.01); G01N 23/046 (2013.01); G01N 23/18 (2013.01); G01N 27/4163 (2013.01); G06N 20/00 (2019.01); G06T 11/003 (2013.01); G01N 2223/04 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01); G01N 2223/426 (2013.01); G01N 2223/645 (2013.01); G01N 2223/646 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01);
Abstract

A system configured to detect defects in a first oxygen sensor is disclosed. The system includes an X-ray imaging device configured to capture a production X-ray image of the first oxygen sensor and an electronic processor configured to use a trained oxygen sensor defect detection model to identify a defect of the first oxygen sensor by producing a pseudo X-ray image by simulating a projection of a fan beam through CT data of a second oxygen sensor. The electronic processor is also configured to measure, via the trained oxygen sensor defect detection model, a fan-beam distortion in the production X-ray image; select, via the trained oxygen sensor defect detection model, the pseudo X-ray image based on the fan-beam distortion; perform a comparison, via the trained oxygen sensor defect detection model, of the production X-ray image to the pseudo X-ray image; and, classify, based on the comparison, the production X-ray image as representing an improperly assembled oxygen sensor.


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