The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

May. 10, 2019
Applicant:

Carrier Corporation, Palm Beach Gardens, FL (US);

Inventors:

David L. Lincoln, Cromwell, CT (US);

Michael J. Birnkrant, Wethersfield, CT (US);

Jose-Rodrigo Castillo-Garza, West Hartford, CT (US);

Marcin Piech, East Hampton, CT (US);

Catherine Thibaud, Cork, IR;

Michael J. Giering, Bolton, CT (US);

Kishore K. Reddy, Vernon, CT (US);

Vivek Venugopalan, South Riding, VA (US);

Assignee:

Carrier Corporation, Palm Beach Gardens, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/552 (2014.01); G01N 27/12 (2006.01); G01N 29/036 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/553 (2013.01); G01N 27/125 (2013.01); G01N 29/036 (2013.01); G01N 33/0034 (2013.01); G01N 2201/1296 (2013.01); G01N 2291/0256 (2013.01);
Abstract

An example SPR detection system includes a first prism having a first surface adjacent to a first metal layer exposed to a sample gas, and a second prism having a second surface adjacent to a second metal layer exposed to a reference gas. At least one light source is configured to provide respective beams to the first and second surfaces, where each of the beams causes SPR of a respective one of the metal layers. At least one photodetector is configured to measure a reflection property of reflections of the respective beams from the metal layers during the SPR. A controller is configured to determine whether a target gas is present in the sample gas based on a known composition of the reference gas and at least one of an electrical property of the first and second metal layers during the SPR and the reflection property of the metal layers.


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