The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2024
Filed:
May. 31, 2019
Applicant:
Universidad Del Pais Vasco/euskal Herriko Unibertsitatea, Vizcaya, ES;
Inventors:
Thomas Schafer, San Sebastian, ES;
Iliane Rafaniello, San Sebastian, ES;
Assignee:
UNIVERSIDAD DEL PAIS VASCO/EUSKAL HERRIKO UNIBERTSITATEA, Vizcaya, ES;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 65/02 (2006.01); B01D 61/14 (2006.01); B01D 65/10 (2006.01); C02F 1/00 (2023.01); C02F 1/44 (2023.01); G01N 17/00 (2006.01);
U.S. Cl.
CPC ...
G01N 17/008 (2013.01); B01D 61/145 (2013.01); B01D 65/02 (2013.01); B01D 65/109 (2022.08); C02F 1/008 (2013.01); C02F 1/444 (2013.01); B01D 2321/16 (2013.01); C02F 2303/14 (2013.01); C02F 2303/16 (2013.01); C02F 2303/20 (2013.01);
Abstract
A method for the detection and monitoring of surface fouling from the nanoscale as a predictive or real-time monitoring tool is provided. Also provided are devices for carrying out the method, and to uses of the method, in particular for optimising cleaning procedures of devices or components thereof fouled by flows of foulant.