The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Apr. 27, 2020
Applicant:

Cytochip Inc., Irvine, CA (US);

Inventor:

Wendian Shi, Irvine, CA (US);

Assignee:

CytoChip Inc., Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/10 (2006.01); G01N 15/0205 (2024.01); G01N 15/14 (2006.01); G01N 33/49 (2006.01); G01N 15/01 (2024.01);
U.S. Cl.
CPC ...
G01N 15/1012 (2013.01); G01N 15/0205 (2013.01); G01N 15/1459 (2013.01); G01N 33/4915 (2013.01); G01N 15/01 (2024.01); G01N 2015/1493 (2013.01);
Abstract

Methods and devices for correction in particle size measurement are disclosed. In some embodiments, a method includes the following steps: (1) measuring a signal from a target particle and a reference particle in a cartridge device; (2) analyzing the measured signal to obtain signal information of the target particle and signal information of the reference particle; and (3) determining size information of the target particle by correcting the signal information of the target particle with the signal information of the reference particle. In other embodiments, a device includes a cartridge and an analyzer. The analyzer is configured to receive the cartridge into the analyzer, measure a signal from the target particle and the reference particle, analyze the measured signal to obtain signal information, and determine size information of the target particle.


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