The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Jul. 06, 2022
Applicant:

Okuma Corporation, Niwa-Gun, JP;

Inventors:

Tetsuya Matsushita, Niwa-Gun, JP;

Takuya Kojima, Niwa-Gun, JP;

Assignee:

Okuma Corporation, Niwa-Gun, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/012 (2006.01); B23Q 15/12 (2006.01);
U.S. Cl.
CPC ...
G01B 5/012 (2013.01); B23Q 15/12 (2013.01);
Abstract

An error identification method includes: installing a calibrator including a sphere row A and a sphere row B in which a plurality of spheres are linearly aligned in a direction perpendicular to the sphere row A on a table such that the sphere row A and the sphere row B are approximately parallel to respective two of the translational axes and measuring positions of a plurality of spheres of the sphere row A and the sphere row B using a position measurement sensor tool; rotating the calibrator to a plurality of angles around a normal direction on the upper surface of the table to install on the table and measuring each position of the plurality of spheres of the sphere row A and the sphere row B; and identifying an error of the translational axis based on measured values in the installing and the rotating.


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