The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Jun. 05, 2023
Applicant:

Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing, CN;

Inventors:

Fei Tian, Beijing, CN;

Jiangyun Zhang, Beijing, CN;

Wenhao Zheng, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 49/00 (2006.01); G01V 20/00 (2024.01);
U.S. Cl.
CPC ...
E21B 49/00 (2013.01); G01V 20/00 (2024.01); E21B 2200/22 (2020.05);
Abstract

The present description relates to the field of geological exploration, and discloses a method and system for extracting features of logging while drilling and drilling-time logging based on Unet dual-channel output, aiming at solving the problem that the prior art 5 cannot integrate various types of information for lithology classification. The present invention comprises: acquiring stratum data of different wells; eliminating outliers, normalizing and resampling; performing data reconstruction via a self-encoder-based artificial neural network based on the pre-trained data to obtain stratum reconstructed data for training; inputting the data to be analyzed from shallow to deep in segments, performing 10 dynamic optimization while drilling on the pre-trained self-encoder-based artificial neural network by a quantile loss function; and extracting the independent components output by the encoder dual-channel for unsupervised clustering, and fitting to obtain a stratum lithology determination result corresponding to the current data to be analyzed.


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