The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2024
Filed:
Dec. 22, 2021
Meta Platforms Technologies, Llc;
Sheng Ye, Redmond, WA (US);
Hao Mei, Redmond, WA (US);
Cody Wayne Weyhrich, Phoenix, AZ (US);
Arman Boromand, Redmond, WA (US);
Andrew John Ouderkirk, Redmond, WA (US);
Christopher Yuan Ting Liao, Seattle, WA (US);
Emma Rae Mullen, Seattle, WA (US);
Christopher Stipe, Woodinville, WA (US);
Nagi Hosni Elabbasi, Southborough, MA (US);
Rui Jian, Fremont, CA (US);
Meta Platforms Technologies, LLC, Menlo Park, CA (US);
Abstract
A mechanically and piezoelectrically anisotropic polymer thin film is formed from a crystallizable polymer and an additive configured to interact with the polymer to facilitate chain alignment and, in some examples, create a higher crystalline content within the polymer thin film. The polymer thin film and its method of manufacture may be characterized by a bimodal molecular weight distribution where the molecular weight of the additive may be less than approximately 5% of the molecular weight of the crystallizable polymer. Example polymers may include vinylidene fluoride, trifluoroethylene, chlorotrifluoroethylene, hexafluoropropylene, and vinyl fluoride. Example additives may occupy up to approximately 60 wt. % of the polymer thin film. The polymer thin film may be characterized by a piezoelectric coefficient (d) of at least approximately 5 pC/N or an electromechanical coupling factor (k) of at least approximately 0.1.