The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2024

Filed:

Dec. 18, 2020
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Risa Arai, Tama, JP;

Daiki Ariyoshi, Chofu, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 1/045 (2006.01); A61B 1/05 (2006.01); A61B 1/06 (2006.01);
U.S. Cl.
CPC ...
A61B 1/00006 (2013.01); A61B 1/00009 (2013.01); A61B 1/0005 (2013.01); A61B 1/045 (2013.01); A61B 1/05 (2013.01); A61B 1/0638 (2013.01); A61B 1/0655 (2022.02);
Abstract

An endoscope system includes a light source apparatus configured to generate first/second illumination light, an image pickup apparatus, a switching instruction device configured to be able to set one of a first observation mode in which an image obtained by image pickup of an object illuminated with the first illumination light is displayed and a second observation mode in which an image obtained by processing a color/pattern of an image obtained by image pickup of the object illuminated with the second illumination light is displayed and a processor configured to calculate a feature value indicating movement of a distal end portion of an endoscope and disable an instruction for setting the second observation mode when the feature value is equal to or higher than a predetermined threshold.


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