The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Jun. 23, 2021
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Masashi Kanai, Azumino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01J 3/46 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G01J 3/0297 (2013.01); G01J 3/462 (2013.01); G01J 2003/2866 (2013.01);
Abstract

A calibration device includes one or more processors. The one or more processors acquire a measured value obtained when a spectroscopic light source configured to output uniform light with a predetermined spectroscopic wavelength and configured to change the spectroscopic wavelength outputs the uniform light while changing the spectroscopic wavelength of the uniform light and a spectroscopic measurement unit to be calibrated spectroscopically measures the outputted uniform light. The one or more processors acquire a target value for each of the spectroscopic wavelengths obtained when the spectroscopic measurement unit measures the uniform light. The one or more processors calculate a transformation matrix for transforming the measured value, based on the measured value and the target value.


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