The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Aug. 20, 2020
Samsung Electronics Co., Ltd., Suwon-si, KR;
Dalin Zhu, Richardson, TX (US);
Boon Loong Ng, Plano, TX (US);
Jianhua Mo, Allen, TX (US);
Anum Ali, Plano, TX (US);
Daehee Park, Hwaseong-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
Methods and apparatuses for selecting beams. A method includes determining, based on a channel condition, whether to use an adaptive selection method or a cycling selection method to select a subset of a plurality of beams for a beam measurement; based on the channel condition being a first channel condition, using the adaptive selection method to select the subset of beams; and based on the channel condition being a second channel condition, using the cycling selection method to select the subset of beams. The method further includes performing the beam measurement on the selected subset of beams, generating beam measurement information based on the beam measurement on the selected subset of beams, and determining one or more of the plurality of beams to use for a wireless communication based on the beam measurement information.