The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Aug. 31, 2022
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Chadi Khirallah, Tokyo, JP;
Yuhua Chen, Tokyo, JP;
Yassin Aden Awad, Tokyo, JP;
Alberto Suarez, Tokyo, JP;
Robert Arnott, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/309 (2015.01); H04B 7/06 (2006.01); H04W 24/10 (2009.01); H04W 36/00 (2009.01); H04W 36/30 (2009.01);
U.S. Cl.
CPC ...
H04B 17/309 (2015.01); H04B 7/0695 (2013.01); H04W 24/10 (2013.01); H04W 36/0094 (2013.01); H04W 36/30 (2013.01);
Abstract
A method, performed by a communication device, including a) measuring a respective beam quality for each of a plurality of beams of a cell, b) identifying, within said plurality of beams, a first group of beams comprising a number, N, of beams, c) selecting, from within said first group of beams, a second group of beams comprising a number, M, of beams, and d) deriving a cell quality for the cell based on the measured beam qualities for the M beams of the second group.