The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Apr. 13, 2021
Accenture Global Solutions Limited, Dublin, IE;
Makoto Murai, Tokyo, JP;
Shin Moriga, Tokyo, JP;
Atsushi Suyama, Edogawa-ku, JP;
Motoaki Hayashi, Shibuya-ku, JP;
Takuya Kudo, Kirkland, WA (US);
Accenture Global Solutions Limited, Dublin, IE;
Abstract
The present disclosure describes a computer-implemented method for detecting anomalies during lot production, wherein the products within a production lot are processed according to a sequence of steps that include manufacturing steps and one or more quality control steps interspersed among the manufacturing steps, the method comprising: obtaining process quality inspection data from each of the one or more quality control steps for a first production lot; obtaining product characteristics data for the products in the first production lot after the final step in the sequence; training a Gaussian process regression model using the process quality inspection data and the product characteristics data from the first production lot; generating a predictive distribution of the product characteristics data using the Gaussian process regression model that uses a bathtub kernel function; obtaining process quality inspection data from each of the quality control steps for a second production lot; identifying anomalies in the second production lot using the predictive distribution of the product characteristics data and the process quality inspection data from the second production lot; if no anomalies are detected in the second production lot, updating the Gaussian process regression model using the process quality inspection data from the second production lot; setting target values for one or more values in the process quality inspection data based on the predictive distribution of the product characteristic; and adjusting settings of one or more manufacturing steps based on the target values.