The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

May. 12, 2022
Applicant:

Analytik Jena Gmbh, Jena, DE;

Inventors:

Roland Lehmann, Jena, DE;

Wolfram Weisheit, Saara, DE;

Iouri Kalinitchenko, Jena-Maua, DE;

Assignee:

Analytik Jena GmbH, Jena, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/10 (2006.01); H01J 49/00 (2006.01); H01J 49/04 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
H01J 49/105 (2013.01); H01J 49/0031 (2013.01); H01J 49/0495 (2013.01); H01J 49/067 (2013.01);
Abstract

A method of operating an inductively coupled plasma mass spectrometry apparatus for analyzing an analyte sample, the mass spectrometry apparatus including a plasma ion source, a mass analyzer and an interface arrangement positioned between the plasma ion source and the mass analyzer of the mass spectrometer, the interface arrangement at least including an interface structure, including a sampling or skimmer cone, and at least one passage with an inlet and an outlet into a reaction zone, the method including: generating a plasma using the plasma ion source and forming a plasma flux to flow towards the mass analyzer; supplying the analyte sample into the reaction zone via the passage such that the analyte sample interacts with the plasma flux; and analyzing the analyte sample using the mass analyzer.


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